The low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer scale objects: application to carbon nanotubes

P. Dorozhkin; H. Nejoh; D. Fujita

doi:10.1116/1.1481756

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The low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer scale objects: application to carbon nanotubes

P. Dorozhkin·H. Nejoh·D. Fujita

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Abstract

We have developed a simple and reliable technique for two-terminal transport measurements of free-standing wire-like objects. The method is based on the low-energy electron point source microscope. The field emission tip of the microscope is used as a movable electrode to make a well-defined local electrical contact on a controlled place of a nanometer-size object. This allows transport measurements of the object to be conducted. The technique was applied to carbon nanotube ropes.

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P. Dorozhkin, H. Nejoh, D. Fujita. 2002-02-24. The low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer scale objects: application to carbon nanotubes. https://doi.org/10.1116/1.1481756

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