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Dynamic response of the dielectric and electro-optic properties of epitaxial ferroelectric thin films

B. H. Hoerman·B. M. Nichols·B. W. Wessels
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Abstract

An analysis of the dynamic dielectric and electro-optic relaxation response of thin film ferroelectrics is presented. The analysis is based upon the relaxation of ferroelectric domains with a continuous distribution of sizes given by percolation theory. The resulting temporal response is described by the expression (t^-m) exp(-(t/tau)^beta). The analysis was applied to KNbO3 thin films. Measurements of the polarization, birefringence and dielectric transients show qualitative agreement with the model over 11 orders of magnitude in time.

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B. H. Hoerman, B. M. Nichols, B. W. Wessels. 2002-04-30. Dynamic response of the dielectric and electro-optic properties of epitaxial ferroelectric thin films. https://doi.org/10.1103/physrevb.65.224110

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