arXiv · cond-mat/0206016
Analysis of integrated single-electron memory operation
Abstract
Various aspects of single-electron memory are discussed. In particular, we analyze the single-electron charging by Fowler-Nordheim tunneling, propose the idea of background charge compensation, and discuss the defect-tolerant architecture based on nanofuses.
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Alexander N. Korotkov. 2002-06-02. Analysis of integrated single-electron memory operation. https://doi.org/10.1063/1.1521788
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