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Defect-induced perturbations of atomic monolayers on solid surfaces

H. Schiessel·G. Oshanin·A. M. Cazabat·M. Moreau
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Abstract

We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance above the substrate. Representing the monolayer in terms of a suitably extended Frenkel-Kontorova-type model, we calculate the defect-induced density profiles for several possible geometries. In case of an AFM tip, we also determine the extra force exerted on the tip due to the tip-induced de-homogenization of the monolayer.

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H. Schiessel, G. Oshanin, A. M. Cazabat, M. Moreau. 2002-06-10. Defect-induced perturbations of atomic monolayers on solid surfaces. https://doi.org/10.1103/physreve.66.056130

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