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Distribution of voltage fluctuations in a current-biased conductor

M. Kindermann·Yu. V. Nazarov·C. W. J. Beenakker
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Abstract

We calculate the fluctuating voltage V(t) over a conductor driven out of equilibrium by a current source. This is the dual of the shot noise problem of current fluctuations I(t) in a voltage-biased circuit. In the single-channel case the distribution of the accumulated phase Phi=(e/hbar)\int Vdt is the Pascal (or binomial waiting-time) distribution -- distinct from the binomial distribution of transferred charge Q=\int Idt. The weak-coupling limit of a Poissonian P(Phi) is reached in the limit of a ballistic conductor, while in the tunneling limit P(Phi) has the chi-square form.

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M. Kindermann, Yu. V. Nazarov, C. W. J. Beenakker. 2002-10-28. Distribution of voltage fluctuations in a current-biased conductor. https://doi.org/10.1103/physrevlett.90.246805

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