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Microscopic Method for Dislocation Tracking

M. Patriarca·M. Robles·K. Kaski
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Abstract

We show that a microscopic definition of crystal defect, based on the effective mean single-particle potential energy, makes it possible to detect and visualize various types of local and extended crystal defects and develop an effective algorithm for tracking their time evolution.

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M. Patriarca, M. Robles, K. Kaski. 2002-12-13. Microscopic Method for Dislocation Tracking. https://arxiv.org/abs/cond-mat/0212318

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