Effects of Boron Purity, Mg Stoichiometry and Carbon Substitution on Properties of Polycrystalline MgB$_{2}$

Abstract

By synthesizing MgB$_{2}$ using boron of different nominal purity we found values of the residual resistivity ratio ($RRR = R(300 K) / R(42 K)$) from 4 to 20, which covers almost all values found in literature. To obtain high values of $RRR$, high purity reagents are necessary. With the isotopically pure boron we obtained the highest $RRR \sim$ 20 for the stoichiometric compound. We also investigated Mg$_{x}$$^{11}$B$_{2}$ samples with 0.8 $< x <$ 1.2. For the range Mg$_{0.8}$$^{11}$B$_{2}$ up to Mg$_{1.2}$$^{11}$B$_{2}$ we found average values of $RRR$ between 14 and 24. For smaller variations in stoichiometry ($x=1\pm 0.1$) $RRR = 18 \pm 3$. All of our data point to the conclusion that high $RRR$ ($\sim 20$) and low $ρ_{0}$ ($\leq 0.4 μΩcm$) are intrinsic material properties associated with high purity MgB$_{2}$. In addition we have performed initial work on optimizing the formation of carbon doped MgB$_{2}$ via the use of B$_{4}$C. Nearly single phase material can be formed by reaction of nominal Mg(B$_{0.8}$C$_{0.2}$)$_{2}$ for 24 hours at $1200^{\circ}C$. The $T_{c}$ for this composition is between $21.9 K$ and $22.7 K$ (depending on criterion).