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Shot noise in frustrated single-electron arrays

Daniel M. Kaplan·Victor A. Sverdlov·Konstantin K. Likharev
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Abstract

We have carried out numerical simulations of shot noise in 2D arrays of single-electron islands with random background charges. The results show that in contrast with the 1D arrays, at low currents the current noise is strongly colored, and its spectral density levels off at very low frequencies. The Fano factor may be much larger than unity, due to the remnants of single-electron/hole avalanches. However, even very small thermal fluctuations reduce the Fano factor below 1 for almost any bias.

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Daniel M. Kaplan, Victor A. Sverdlov, Konstantin K. Likharev. 2003-03-22. Shot noise in frustrated single-electron arrays. https://doi.org/10.1063/1.1613359

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