arXiv · cond-mat/0304022
Probe-configuration dependent dephasing in a mesoscopic interferometer
Abstract
Dephasing in a ballistic four-terminal Aharonov-Bohm geometry due to charge and voltage fluctuations is investigated. Treating two terminals as voltage probes, we find a strong dependence of the dephasing rate on the probe configuration in agreement with a recent experiment by Kobayashi et al. (J. Phys. Soc. Jpn. 71, 2094 (2002)). Voltage fluctuations in the measurement circuit are shown to be the source of the configuration dependence.
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G. Seelig, S. Pilgram, A. N. Jordan, M. Buttiker. 2003-04-01. Probe-configuration dependent dephasing in a mesoscopic interferometer. https://doi.org/10.1103/physrevb.68.161310
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