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Experimental measurements of multiple stable trapped domain wall states induced in nanofabricated elements

D. Lacour·J. A. Katine·L. Folks·T. Block·J. R. Childress·M. J. Carey·B. A. Gurney
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Abstract

The presence of a domain wall trapped by a sub-micron notch is probed in two ways: through electronic transport measurements and by Magnetic Force Microscopy (MFM). We observe complex magnetic features which are consistent with numerical simulations predicting the existence of multiple magnetic configurations stabilized by the notch structure.

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D. Lacour, J. A. Katine, L. Folks, T. Block, J. R. Childress, M. J. Carey, B. A. Gurney. 2003-06-18. Experimental measurements of multiple stable trapped domain wall states induced in nanofabricated elements. https://arxiv.org/abs/cond-mat/0306486

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