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Electronic Transport through YBCO Grain Boundary Interfaces between 4.2 K and 300 K

C. W. Schneider·S. Hembacher·G. Hammerl·R. Held·A. Schmehl·A. Weber·T. Kopp·J. Mannhart
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Abstract

The current-induced dissipation in YBCO grain boundary tunnel junctions has been measured between 4.2 K and 300 K. It is found that the resistance of 45 degree (100)/(110) junctions decreases linearly by a factor of four when their temperature is increased from 100 K to 300 K. At the superconducting transition temperature Tc the grain boundary resistance of the normal state and of the superconducting state extrapolate to the same value.

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C. W. Schneider, S. Hembacher, G. Hammerl, R. Held, A. Schmehl, A. Weber, T. Kopp, J. Mannhart. 2003-11-19. Electronic Transport through YBCO Grain Boundary Interfaces between 4.2 K and 300 K. https://doi.org/10.1103/physrevlett.92.257003

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