arXiv · cond-mat/0307715
A Model for Striped Growth
Abstract
We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.
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Hai Qian, Gene F. Mazenko. 2003-07-29. A Model for Striped Growth. https://doi.org/10.1103/physreve.69.011104
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