arXiv · cond-mat/0309134
Gate-induced ionization of single dopant atoms
Abstract
Gate-induced wave function manipulation of a single dopant atom is a possible basis of atomic scale electronics. From this perspective, we analyzed the effect of a small nearby gate on a single dopant atom in a semiconductor up to field ionization. The dopant is modelled as a hydrogen-like impurity and the Schrodinger equation is solved by a variational method. We find that--depending on the separation of the dopant and the gate--the electron transfer is either gradual or abrupt, defining two distinctive regimes for the gate-induced ionization process.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
G. D. J. Smit, S. Rogge, J. Caro, T. M. Klapwijk. 2003-09-05. Gate-induced ionization of single dopant atoms. https://doi.org/10.1103/physrevb.68.193302
Cite the original work for its findings. Save a collection to share your selection of sources.