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Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator

Eric D. Black·Ivan S. Grudinin·Shanti R. Rao·Kenneth G. Libbrecht
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Abstract

We have developed a new technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump beam and the sensitivity of the probe beam. The result is an enhancement of the response of the instrument by a factor proportional to the square of the finesse of the cavity over conventional interferometric measurements. In this paper we present a description of the technique, and we discuss how the properties of thin films can be deduced from the photothermal response. As an example of the technique, we report a measurement of the thermal properties of a multilayer dielectric mirror similar to those used in interferometric gravitational wave detectors.

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Eric D. Black, Ivan S. Grudinin, Shanti R. Rao, Kenneth G. Libbrecht. 2004-01-06. Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator. https://doi.org/10.1063/1.1728312

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