arXiv · cond-mat/0404371
Line Shape Analysis of Linear X Ray Magnetic Scattering CoPt Thin Films
Abstract
Data analysis of the CCD files from x ray magnetic resonance scattering linearly polarized in transmission geometry produces information about the radial and azimuthal intensities. In a series of measurements of increasing photon energies trends in data are analyzed.
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E. V. R. Chan. 2004-04-16. Line Shape Analysis of Linear X Ray Magnetic Scattering CoPt Thin Films. https://arxiv.org/abs/cond-mat/0404371
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