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Pulsed Laser Deposition of a PBN:65 Morphotropic Phase Boundary Thin Film with Large Electrostriction

Xi Yang·A. W. Beckwith
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Abstract

We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 um2/V2, and it is consistent with what we measured in the reflection experiment.

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Xi Yang, A. W. Beckwith. 2005-01-03. Pulsed Laser Deposition of a PBN:65 Morphotropic Phase Boundary Thin Film with Large Electrostriction. https://doi.org/10.2478/bf02475585

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