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Temperature Dependence of Piezoelectric and Electrostrictive Properties in a PBN:65 Morphotropic Phase Boundary Thin Film

Xi Yang·A. W. Beckwith
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Abstract

We used an optical reflection method to measure the temperature-dependence of the piezoelectricity, electrostriction and time constant of a morphotropic phase boundary (MPB) thin film. We obtained the piezoelectric constant and the electrostrictive constant as a function of temperature by curve fitting the experimental data. We also obtained the time constant as a function of temperature and applied voltage. An abnormal behavior of the strain that was larger at 275 K than at 285 K was observed. This observation was also consistent with the minimal hysteresis behavior of the time constant at 275 K. We provided a possible explanation for this observation.

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Xi Yang, A. W. Beckwith. 2005-01-07. Temperature Dependence of Piezoelectric and Electrostrictive Properties in a PBN:65 Morphotropic Phase Boundary Thin Film. https://arxiv.org/abs/cond-mat/0501131

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