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Simultaneous current-, force- and work function measurement with atomic resolution

M. Herz·Ch. Schiller·F. J. Giessibl·J. Mannhart
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Abstract

The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the sample in real time as a function of the cantilever's deflection. Atomically resolved work function measurements on a silicon (111)-($7\times 7$) surface are presented and related to concurrently recorded tunneling current- and force- measurements.

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M. Herz, Ch. Schiller, F. J. Giessibl, J. Mannhart. 2005-01-19. Simultaneous current-, force- and work function measurement with atomic resolution. https://doi.org/10.1063/1.1900316

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