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Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology

R. L. Meng·T. H. Johansen·I. A. Rusakova·A. Baikalov·D. Pham·F. Chen·Z. Y. Zuo·C. W. Chu
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Abstract

We report a simple and easily controllable method where a nano-undulated surface morphology of Nd1/3Eu1/3Gd1/3Ba2Cu3Ox (NEG) films leads to a substantial increase in the critical current density in superconducting YBa2Cu3Ox (YBCO) films deposited by pulsed laser deposition on such NEG layers. The enhancement is observed over a wide range of fields and temperatures. Transmission electron microscopy shows that such YBCO films possess a high density of localized areas, typically 20 x 20 nm2 in size, where distortion of atomic planes give rotational (2 to 5 degrees) moire patterns. Their distribution is random and uniform, and expected to be the origin of the enhanced flux pinning. Magneto-optical imaging shows that these films have excellent macroscopic magnetic uniformity.

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R. L. Meng, T. H. Johansen, I. A. Rusakova, A. Baikalov, D. Pham, F. Chen, Z. Y. Zuo, C. W. Chu. 2005-06-02. Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology. https://doi.org/10.1016/j.physc.2005.11.013

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