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Polarization Relaxation Induced by Depolarization Field in Ultrathin Ferroelectric BaTiO$_3$ Capacitors

D. J. Kim·J. Y. Jo·Y. S. Kim·Y. J. Chang·J. S. Lee·Jong-Gul Yoon·T. K. Song·T. W. Noh
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Abstract

Time-dependent polarization relaxation behaviors induced by a depolarization field $E_{d}$ were investigated on high-quality ultrathin SrRuO$_{3}$/BaTiO$_{3}$/SrRuO$_{3}$ capacitors. The $E_d$ values were determined experimentally from an applied external field to stop the net polarization relaxation. These values agree with those from the electrostatic calculations, demonstrating that a large $E_{d}$ inside the ultrathin ferroelectric layer could cause severe polarization relaxation. For numerous ferroelectric devices of capacitor configuration, this effect will set a stricter size limit than the critical thickness issue.

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D. J. Kim, J. Y. Jo, Y. S. Kim, Y. J. Chang, J. S. Lee, Jong-Gul Yoon, T. K. Song, T. W. Noh. 2005-10-14. Polarization Relaxation Induced by Depolarization Field in Ultrathin Ferroelectric BaTiO$_3$ Capacitors. https://doi.org/10.1103/physrevlett.95.237602

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