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Polarized resonant inelastic x-ray scattering as an ultra-fine probe of excited states in La2CuO4

A. Shukla·M. Calandra·M. Taguchi·A. Kotani·G. Vanko·S-W. Cheong
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Abstract

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized Resonant Inelastic X-Ray Scattering in La2CuO4 at the Cu K-edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular we identify a non-local effect namely a transition to off-site Cu 3d states.

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A. Shukla, M. Calandra, M. Taguchi, A. Kotani, G. Vanko, S-W. Cheong. 2005-06-24. Polarized resonant inelastic x-ray scattering as an ultra-fine probe of excited states in La2CuO4. https://doi.org/10.1103/physrevlett.96.077006

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