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Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations

Jonas Bylander·Tim Duty·Per Delsing
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Abstract

We present experimental and numerical results from a real-time detection of time-correlated single-electron tunneling oscillations in a one-dimensional series array of small tunnel junctions. The electrons tunnel with a frequency f=I/e, where I is the current and e is the electron charge. Experimentally, we have connected a single-electron transistor to the last array island, and in this way measured currents from 5 fA to 1 pA by counting the single electrons. We find that the line width of the oscillation is proportional to the frequency f. The experimental data agrees well with numerical simulations.

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Jonas Bylander, Tim Duty, Per Delsing. 2005-08-29. Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations. https://doi.org/10.1063/1.2355244

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