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Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique

P. Mukherjee·A. Sarkar·P. Barat·T. Jayakumar·S. Mahadevan·Sanjay K. Rai
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Abstract

Determination of lattice misfit and microstructural parameters of the coherent precipitates in Ni based alloy Inconel-625 is a challenging problem as their peaks are completely overlapping among themselves and also with the matrix. We have used a novel X-ray diffraction technique on the bulk samples of Inconel 625 at different heat-treated conditions to determine the lattice parameters, the lattice misfit of the coherent precipitates with the matrix and their microstructural parameters like size and strain.

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P. Mukherjee, A. Sarkar, P. Barat, T. Jayakumar, S. Mahadevan, Sanjay K. Rai. 2006-04-08. Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique. https://arxiv.org/abs/cond-mat/0604222

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