arXiv · cond-mat/0606192
Evidence for mass renormalization in LaNiO$"" sub 3_: an in situ soft x-ray photoemission study of epitaxial films
Abstract
We investigate the electronic structure of high-quality single-crystal LaNiO$_3$ (LNO) thin films using in situ photoemission spectroscopy (PES). The in situ high-resolution soft x-ray PES measurements on epitaxial thin films reveal the intrinsic electronic structure of LNO. We find a new sharp feature in the PES spectra crossing the Fermi level, which is derived from the correlated Ni 3$d$ $e_g$ electrons. This feature shows significant enhancement of spectral weight with decreasing temperature. From a detailed analysis of resistivity data, the enhancement of spectral weight is attributed to increasing electron correlations due to antiferromagnetic fluctuations.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
K. Horiba, R. Eguchi, M. Taguchi, A. Chainani, A. Kikkawa, Y. Senba, H. Ohashi, S. Shin. 2006-06-07. Evidence for mass renormalization in LaNiO$"" sub 3_: an in situ soft x-ray photoemission study of epitaxial films. https://doi.org/10.1103/physrevb.76.155104
Cite the original work for its findings. Save a collection to share your selection of sources.