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Electrical Characterization of PbZr0.4Ti0.6O3 Capacitors

P. Zubko·D. J. Jung·J. F. Scott
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Abstract

We have conducted a careful study of current-voltage (I-V) characteristics in fully integrated commercial PbZr0.4Ti0.6O3 thin film capacitors with Pt bottom and Ir/IrO2 top electrodes. Highly reproducible steady state I-V were obtained at various temperatures over two decades in voltage from current-time data and analyzed in terms of several common transport models including space charge limited conduction, Schottky thermionic emission under full and partial depletion and Poole-Frenkel conduction, showing that the later is the most plausible leakage mechanism in these high quality films. In addition, ferroelectric hysteresis loops and capacitance-voltage data were obtained over a large range of temperatures and discussed in terms of a modified Landau-Ginzburg-Devonshire theory accounting for space charge effects.

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P. Zubko, D. J. Jung, J. F. Scott. 2006-07-23. Electrical Characterization of PbZr0.4Ti0.6O3 Capacitors. https://doi.org/10.1063/1.2382479

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