arXiv · cond-mat/0607608
Magnetoresistance in Thin Permalloy Film (10nm-thick and 30-200nm-wide) Nanocontacts Fabricated by e-Beam Lithography
Abstract
In this paper we show spin dependent transport experiments in nanoconstrictions ranging from 30 to 200nm. These nanoconstrictions were fabricated combining electron beam lithography and thin film deposition techniques. Two types of geometries have been fabricated and investigated. We compare the experimental results with the theoretical estimation of the electrical resistance. Finally we show that the magnetoresistance for the different geometries does not scale with the resistance of the structure and obtain drops in voltage of 20mV at 20Oe.
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Nicolas Garcia, Cheng Hao, Lu Yonghua, Manuel. Munoz, Yifang Chen, Zhengqi Lu, Yun Zhou, Genhua Pan, Zheng Cui, A. A. Pasa. 2006-07-24. Magnetoresistance in Thin Permalloy Film (10nm-thick and 30-200nm-wide) Nanocontacts Fabricated by e-Beam Lithography. https://doi.org/10.1063/1.2337538
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