arXiv · cond-mat/0608623
X-ray Raman scattering study of aligned polyfluorene
Abstract
We present a non-resonant inelastic x-ray scattering study at the carbon K-edge on aligned poly[9,9-bis(2-ethylhexyl)-fluorene-2,7-diyl] and show that the x-ray Raman scattering technique can be used as a practical alternative to x-ray absorption measurements. We demonstrate that this novel method can be applied to studies on aligned $π$-conjugated polymers complementing diffraction and optical studies. Combining the experimental data and a very recently proposed theoretical scheme we demonstrate a unique property of x-ray Raman scattering by performing the symmetry decomposition on the density of unoccupied electronic states into $s$- and $p$-type symmetry contributions.
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S. Galambosi, M. Knaapila, J. A. Soininen, K. Nygård, S. Huotari, F. Galbrecht, U. Scherf, A. P. Monkman, K. Hämäläinen. 2006-08-29. X-ray Raman scattering study of aligned polyfluorene. https://doi.org/10.1021/ma060823u
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