arXiv · cond-mat/9412079
Geometry and quantum delocalization of interstitial oxygen in silicon
Abstract
The problem of the geometry of interstitial oxygen in silicon is settled by proper consideration of the quantum delocalization of the oxygen atom around the bond-center position. The calculated infrared absorption spectrum accounts for the 517 and 1136 cm$^{-1}$ bands in their position, character, and isotope shifts. The asymmetric lineshape of the 517 cm$^{-1}$ peak is also well reproduced. A new, non-infrared-active, symmetric-stretching mode is found at 596 cm$^{-1}$. First-principles calculations are presented supporting the nontrivial quantum delocalization of the oxygen atom.
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Emilio Artacho, Arturo Lizon-Nordstrom, Felix Yndurain. 1994-12-15. Geometry and quantum delocalization of interstitial oxygen in silicon. https://doi.org/10.1103/physrevb.51.7862
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