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A Transport Analysis of the BEEM Spectroscopy of Au/Si Schottky Barriers

U. Hohenester·P. Kocevar·P. L. de Andres·F. Flores
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Abstract

A systematic transport study of the ballistic electron emission microscopy (BEEM) of Au/Si(100) and Au/Si(111) Schottky barriers for different thicknesses of the metal layer and different temperatures is presented. It is shown that the existing experimental data are compatible with a recently predicted bandstructure-induced non-forward electron propagation through the Au(111) layer.

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U. Hohenester, P. Kocevar, P. L. de Andres, F. Flores. 1997-10-15. A Transport Analysis of the BEEM Spectroscopy of Au/Si Schottky Barriers. https://doi.org/10.1002/1521-3951(199711)204%3A1%3C397%3A%3Aaid-pssb397%3E3.0.co

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