arXiv · cond-mat/9804179
Current-Induced Step Bending Instability on Vicinal Surfaces
Abstract
We model an apparent instability seen in recent experiments on current induced step bunching on Si(111) surfaces using a generalized 2D BCF model, where adatoms have a diffusion bias parallel to the step edges and there is an attachment barrier at the step edge. We find a new linear instability with novel step patterns. Monte Carlo simulations on a solid-on-solid model are used to study the instability beyond the linear regime.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Da-Jiang Liu, John D. Weeks, Daniel Kandel. 1998-04-16. Current-Induced Step Bending Instability on Vicinal Surfaces. https://doi.org/10.1103/physrevlett.81.2743
Cite the original work for its findings. Save a collection to share your selection of sources.