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Low-temperature far-infrared ellipsometry of convergent beam

A. B. Sushkov·E. A. Tishchenko
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Abstract

Development of an ellipsometry to the case of a coherent far infrared irradiation, low temperatures and small samples is described, including a decision of the direct and inverse problems of the convergent beam ellipsometry for an arbitrary wavelength, measurement technique and a compensating orientation of cryostat windows. Experimental results are presented: for a gold film and UBe13 single crystal at room temperature (lambda=119 um), temperature dependencies of the complex dielectric function of SrTiO3 (lambda=119, 84 and 28 um) and of YBa2Cu3O7-delta ceramic (lambda=119 um).

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A. B. Sushkov, E. A. Tishchenko. 1998-05-19. Low-temperature far-infrared ellipsometry of convergent beam. https://doi.org/10.1007/bf02086222

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