arXiv · cond-mat/9901026
Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν
Abstract
We consider two-dimensional Ising models with randomly distributed ferromagnetic bonds and study the local critical behavior at defect lines by extensive Monte Carlo simulations. Both for ladder and chain type defects, non-universal critical behavior is observed: the critical exponent of the defect magnetization is found to be a continuous function of the strength of the defect coupling. Analyzing corresponding stability conditions, we obtain new evidence that the critical exponent $ν$ of the bulk correlation length of the random Ising model does not depend on dilution, i.e. $ν=1$.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Ferenc Szalma, Ferenc Igloi. 1999-01-05. Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν. https://arxiv.org/abs/cond-mat/9901026
Cite the original work for its findings. Save a collection to share your selection of sources.