arXiv · cond-mat/9908006
Characterisation, Raman, Magnetic and Resistivity measurements in polycrystalline samples of LaMnO3 doped with Cd
Abstract
We report a study of polycrystalline samples of the family La1-xCdxMnO3+dwith different percentage of Mn4+ ions. X-rays diffraction, Iodometric titration, Raman, Magnetic and Electrical Resistivity measurements provide a general characterisation of the physical properties. Results are qualitatively similar to the ones found in Ca doped manganese perovskites. Key words: Cd, manganese perovskites, magnetoresistance, Raman, magnetic, resistivity
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J. Lopez, V. Dediu, P. Nozar, G. Ruani, C. Dionigi, F. C. Matacotta, C. Ferdeghini, G. Calestani. 1999-09-02. Characterisation, Raman, Magnetic and Resistivity measurements in polycrystalline samples of LaMnO3 doped with Cd. https://arxiv.org/abs/cond-mat/9908006
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