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Interfacial Energy and Fine Defect Structures for Incoherent Films

Paolo Cermelli·Morton E. Gurtin·Giovanni Leoni
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Abstract

This note summarizes recent results in which modern techniques of the calculus of variations are used to obtain qualitative features of film-substrate interfaces for a broad class of interfacial energies. In particular, we show that the existence of a critical thickness for incoherency and the formation of interfacial dislocations depend strongly on the convexity and smoothness of the interfacial energy function.

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Paolo Cermelli, Morton E. Gurtin, Giovanni Leoni. 1999-10-26. Interfacial Energy and Fine Defect Structures for Incoherent Films. https://arxiv.org/abs/cond-mat/9910360

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