arXiv · nucl-ex/0509026
Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments
Abstract
The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits.
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S. R. Elliott, V. M. Gehman, K. Kazkaz, D-M. Mei, A. R. Young. 2005-09-20. Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments. https://doi.org/10.1016/j.nima.2005.12.024
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