arXiv · physics/0305018
Bayesian inference of nanoparticle-broadened x-ray line profiles
Abstract
A single and self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO$_{2}$ data. The results demonstrate that the proposed method can determine size distributions, while making the least number of assumptions. The comparison of the Bayesian/MaxEnt results from experimental CeO$_2$ with TEM results is favorable
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N. Armstrong, W. Kalceff, J. P. Cline, J. Bonevich. 2003-05-06. Bayesian inference of nanoparticle-broadened x-ray line profiles. https://arxiv.org/abs/physics/0305018
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