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Coherent X-ray Diffractive Imaging; applications and limitations

S. Marchesini·H. N. Chapman·S. P. Hau-Riege·R. A. London·A. Szoke·H. He·M. R. Howells·H. Padmore·R. Rosen·J. C. H. Spence·U. Weierstall
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Abstract

The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our experimental results, discuss the fundamental limits of this technique and future plans.

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S. Marchesini, H. N. Chapman, S. P. Hau-Riege, R. A. London, A. Szoke, H. He, M. R. Howells, H. Padmore, R. Rosen, J. C. H. Spence, U. Weierstall. 2003-08-15. Coherent X-ray Diffractive Imaging; applications and limitations. https://doi.org/10.1364/oe.11.002344

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