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Power loss in open cavity diodes and a modified Child Langmuir Law

Debabrata Biswas·Raghwendra Kumar·R. R. Puri
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Abstract

Diodes used in most high power devices are inherently open. It is shown that under such circumstances, there is a loss of electromagnetic radiation leading to a lower critical current as compared to closed diodes. The power loss can be incorporated in the standard Child-Langmuir framework by introducing an effective potential. The modified Child-Langmuir law can be used to predict the maximum power loss for a given plate separation and potential difference as well as the maximum transmitted current for this power loss. The effectiveness of the theory is tested numerically.

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Debabrata Biswas, Raghwendra Kumar, R. R. Puri. 2005-07-26. Power loss in open cavity diodes and a modified Child Langmuir Law. https://doi.org/10.1063/1.2030387

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