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Measurement of atomic diffraction phases induced by material gratings

John D. Perreault·Alexander D. Cronin
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Abstract

Atom-surface interactions can significantly modify the intensity and phase of atom de Broglie waves diffracted by a silicon nitride grating. This affects the operation of a material grating as a coherent beam splitter. The phase shift induced by diffraction is measured by comparing the relative phases of serveral interfering paths in a Mach-Zehnder Na atom interferometer formed by three material gratings. The values of the diffraction phases are consistent with a simple model which includes a van der Waals atom-surface interaction between the Na atoms and the silicon nitride grating bars.

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John D. Perreault, Alexander D. Cronin. 2005-08-26. Measurement of atomic diffraction phases induced by material gratings. https://doi.org/10.1103/physreva.73.033610

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