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Dynamical analysis of the buildup process near resonance

Jorge Villavicencio·Roberto Romo
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Abstract

The time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies is studied by considering the analytic solution of the time dependent Schrödinger equation with cutoff plane wave initial conditions. We show that the buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula. We find that the buildup of the off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case which governs the duration of the transient regime. This is evidence that off-resonant and resonant tunneling are two correlated processes, whose transient regime is characterized by the same transient time constant of two lifetimes.

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Jorge Villavicencio, Roberto Romo. 2000-11-09. Dynamical analysis of the buildup process near resonance. https://doi.org/10.1063/1.126982

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