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A. J. T. van der Ree

Publications and source records attributed to A. J. T. van der Ree.

2 recordsLinked to original sources

Engineering Synaptic Dynamics in Ag-Modified TaO$_x$ Memristive Devices

Engineering not only the magnitude but also the dynamics of synaptic weight updates is an important challenge for memristive neuromorphic hardware. Here, we show that Ag modification of TaO$_x$ memristors introduces an electrically selectable degree of freedom in synaptic depression through the interplay between Ag-related and oxygen-vacancy dynamics. Reference devices exhibit conventional bipolar switching, whereas Ag-modified devices display symmetric table-with-legs hysteresis loops, metastable intermediate states, and a strongly non-monotonic dependence of depression dynamics on programming amplitude. By varying only the pulse amplitude, the same device can be driven among three regimes: gradual sigmoidal depression, an abrupt update concentrated within a few pulses, and a broadly distributed evolution extending over more than one hundred pulses. A minimal coupled-state model, in which a vacancy-related switching variable interacts with a slower Ag-related internal degree of freedom, reproduces this gradual--abrupt--gradual crossover using two individually monotonic field-activated processes. The functional impact is assessed in a memristor-based multilayer perceptron. For MNIST, the abrupt, sigmoidal, and slowly evolving responses yield accuracies of approximately 50%, 85%, and 88%, respectively, while the gradual regime reaches approximately 72% for Fashion-MNIST. These results show that coupling Ag-related and oxygen-vacancy dynamics can transform synaptic depression from a fixed device characteristic into an electrically programmable property.

cond-mat.mtrl-sci↗

Tuning the memristive response of TaO$_x$-based devices with Ag Nanoparticles

Defect engineering is a key strategy to control resistive switching (RS) in oxide-based memristive devices, where oxygen vacancy (OV) dynamics governs filament formation and rupture. We investigate the effect of Ag nanoparticles (AgNPs) embedded in the top electrode of Pt/Ta2O5/TaO2/Pt memristors and analyze their RS behavior and statistical stability. Devices without AgNPs exhibit two hysteresis switching loops (HSLs) with opposite chiralities, originating from the participation of the Pt/Ta2O5 top interface and the Ta2O5/TaO2 bottom interface. Incorporating AgNPs reduces the overall device resistance and selectively suppresses one loop, yielding a single, well-defined switching mode. Moreover, devices incorporating Ag-NPs show markedly reduced cycle-to-cycle variability of the high-resistance state, as confirmed by Weibull analysis, indicating improved endurance and switching reproducibility. Within a filamentary RS framework, we attribute this behavior to local metallization of the top interface by AgNPs, which partially inhibit OV transport and confines the RS dynamics to the bottom interface. Numerical simulations with the Oxygen Vacancy Resistive Network (OVRN) model succesfully reproduce the experimental HSLs, statistical trends, and tunable ON/OFF ratios with AgNPs coverage. These findings demonstrate that targeted interface metallization via metallic nanoparticles provides an effective route to control multi-interface RS dynamics and improve switching stability in without modifying the oxide architecture.

cond-mat.mes-hall↗