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A. S. Rotelli

Publications and source records attributed to A. S. Rotelli.

2 recordsLinked to original sources

A Reusable Four-Port S-Parameter to Link-Level Signal-Integrity Analysis Framework for High-Speed Detector Interconnects

A reusable MATLAB signal-integrity (SI) framework is presented that converts compatible four-port S-parameter data, measured by VNA or obtained from electromagnetic simulation, into traceable link-level evidence rather than a single loss metric. Its contribution is the checked, traceable automation of established SI operations while keeping source data, model assumptions, analytical projections, and finite-record observations distinct. The framework is demonstrated on the four 1.25 Gbps differential routes (DP1-DP4) of the PPCB-1347-MuPix11 probe card using PTSL CST Microwave 3D-Solver-derived four-port S-parameters and a virtual time-domain solver. The automated pipeline preflights file structures, performs a power-normalized mixed-mode transformation, applies route-length-aware loss decomposition, constructs a causally loaded channel model, and propagates full PRBS-31 sequences into eye-diagram, conditional-BER, and 8b10b-coded-link analyses. At the 1.25 Gbps data rate (Nyquist 0.625 GHz), DP1-DP4 exhibit differential insertion loss (SDD21) from -0.350 to -0.300 dB, differential-to-common conversion from -31.038 to -28.236 dBc, and modeled FEB-input eye openings from 0.586 to 0.588 V. The comparison shows that path length alone is not an adequate SI ranking variable: DP3 has the lowest Nyquist insertion loss, DP1 the strongest differential-to-common isolation, and DP4 the largest modeled eye. All analytical BER values remain below the reporting floor and therefore do not support a BER ranking. By preserving the distinction between route-dependent waveform behavior, model projections, and finite-record observations, the framework provides an extensible basis for comparative high-speed-interconnect SI analysis from design review through calibrated VNA measurement interpretation.

hep-ex

Investigation of the in-pixel response of the Mupix11 monolithic pixel sensor using a microfocus X-ray beam at Diamond Light Source

MuPix11 is a High-Voltage Monolithic Active Pixel Sensor (HV-MAPS) developed for the tracking system of the Mu3e experiment. The in-pixel photon response of a MuPix11 sensor thinned to 70 {\mu}m was measured using an 8 keV X-ray beam with a 3 {\mu}m spot size at the B16 beamline at Diamond Light Source, emulating the passage of a minimum ionising particle (MIP). At nominal operating voltage and threshold, high-resolution scans across the pixel matrix show the detector response to be uniform. In the absence of reverse bias (0 V), the relative sub-pixel response is location-dependent as a reduced detection rate is observed at pixel boundaries.

physics.ins-det