arXiv subjects

A. Wegmann

Publications and source records attributed to A. Wegmann.

3 recordsLinked to original sources

arXiv2018

Improved limit on neutrinoless double beta decay of $^{76}$Ge from GERDA Phase II

The GERDA experiment searches for the lepton number violating neutrinoless double beta decay of $^{76}$Ge ($^{76}$Ge $\rightarrow$ $^{76}$Se + 2e$^-$) operating bare Ge diodes with an enriched $^{76}$Ge fraction in liquid argon. The exposure for BEGe-type detectors is increased threefold with respect to our previous data release. The BEGe detectors feature an excellent background suppression from the analysis of the time profile of the detector signals. In the analysis window a background level of $1.0_{-0.4}^{+0.6}\cdot10^{-3}$ cts/(keV$\cdot$kg$\cdot$yr) has been achieved; if normalized to the energy resolution this is the lowest ever achieved in any 0$νββ$ experiment. No signal is observed and a new 90 \% C.L. lower limit for the half-life of $8.0\cdot10^{25}$ yr is placed when combining with our previous data. The median expected sensitivity assuming no signal is $5.8\cdot10^{25}$ yr.

nucl-ex↗

arXiv2017

Searching for neutrinoless double beta decay with GERDA

The GERmanium Detector Array (GERDA) experiment located at the INFN Gran Sasso Laboratory (Italy), is looking for the neutrinoless double beta decay of Ge76, by using high-purity germanium detectors made from isotopically enriched material. The combination of the novel experimental design, the careful material selection for radio-purity and the active/passive shielding techniques result in a very low residual background at the Q-value of the decay, about 1e-3 counts/(keV kg yr). This makes GERDA the first experiment in the field to be background-free for the complete design exposure of 100 kg yr. A search for neutrinoless double beta decay was performed with a total exposure of 47.7 kg yr: 23.2 kg yr come from the second phase (Phase II) of the experiment, in which the background is reduced by about a factor of ten with respect to the previous phase. The analysis presented in this paper includes 12.4 kg yr of new Phase II data. No evidence for a possible signal is found: the lower limit for the half-life of Ge76 is 8.0e25 yr at 90% CL. The experimental median sensitivity is 5.8e25 yr. The experiment is currently taking data. As it is running in a background-free regime, its sensitivity grows linearly with exposure and it is expected to surpass 1e26 yr within 2018.

nucl-ex↗

arXiv2013

Ellipsometry with polarisation analysis at cryogenic temperatures inside a vacuum chamber

In this paper we describe a new variant of null ellipsometry to determine thicknesses and optical properties of thin films on a substrate at cryogenic temperatures. In the PCSA arrangement of ellipsometry the polarizer and the compensator are placed before the substrate and the analyzer after it. Usually, the polarizer and the analyzer are rotated to find the intensity minimum searched for in null ellipsometry. In our variant we rotate the polarizer and the compensator instead, both being placed in the incoming beam before the substrate. Therefore the polarization analysis of the reflected beam can be realized by an analyzer at fixed orientation. We developed this method for investigations of thin cryogenic films inside a vacuum chamber, where the analyzer and detector had to be placed inside the cold shield at a temperature of T approx. 90K close to the substrate. All other optical components were installed at the incoming beam line outside the vacuum chamber, including all components which need to be rotated during the measurements. Our null ellipsometry variant has been tested with condensed krypton films on a highly oriented pyrolytic graphite substrate (HOPG) at a temperature of T approx. 25K. We show that it is possible to determine the indices of refraction of condensed krypton and of the HOPG substrate as well as thickness of krypton films with reasonable accuracy.

physics.optics↗