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Alexander J Knowles

Publications and source records attributed to Alexander J Knowles.

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Accurate identification and measurement of the precipitate area by two-stage deep neural networks in novel chromium-based alloys

The performance of advanced materials for extreme environments is underpinned by their microstructure, including the size and distribution of reinforcing phases. Chromium-based superalloys are a recently proposed alternative to conventional face-centred-cubic superalloys for high-temperature applications, such as Concentrated Solar Power, and their development requires efficient measurement of precipitate volume fraction and size distribution from electron microscopy images. Traditional fixed-threshold image processing is sensitive to background noise, generalises poorly across materials, and requires substantial manual measurement effort. To address these bottlenecks, this study proposes DT-SegNet, an end-to-end two-stage deep learning scheme based on YOLOv5 and SegFormer for object detection and segmentation in electron microscopy images. The approach combines the training efficiency of convolutional neural networks at the detection stage with the segmentation accuracy of a Vision Transformer. Numerical experiments show that DT-SegNet substantially outperforms state-of-the-art segmentation tools offered by Weka and ilastik across metrics including accuracy, precision, recall, and F1-score. The model provides a useful tool for alloy-development microstructure examinations and helps address the large datasets associated with high-throughput alloy development.

cs.CV

Rapid Electron Backscatter Diffraction Mapping: Painting by Numbers

Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope (SEM). Conventional EBSD analysis involves raster scanning of the electron beam and the serial analysis of each diffraction pattern in turn. For grain shape, crystallographic texture, and microstructure analysis this can be inefficient. In this work, we present Rapid EBSD, a data fusion approach combining forescatter electron (FSE) imaging with static sparse sampling of EBSD patterns. We segment the FSE image into regions of similar colour (i.e. phase and crystal orientation) and then collect representative EBSD data for each segmented region. This enables microstructural assessment to be performed at the spatial resolution of the (fast) FSE imaging whilst including orientation and phase information from EBSD analysis of representative points. We demonstrate the Rapid EBSD technique on samples of a cobalt based superalloy and a strained dual phase titanium alloy, comparing the results with conventional analysis. Rapid EBSD is advantageous for assessing grain size distributions in time-limited experiments.

cond-mat.mtrl-sci