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Amaury Baret

Publications and source records attributed to Amaury Baret.

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Emissivity by Design: Geometric Mesh Inductance Governs Thermal Radiation in Metallic Nanowire Networks

The thermal infrared emissivity of metallic nanowire networks - the property that makes them candidate low-emissivity transparent electrodes - follows regularities that have resisted physical explanation: a strong wire-diameter dependence with no wire-length dependence, a correlation with sheet resistance that breaks down above ~15 ohm/sq, and an angular signature that turns from dielectric-like to metallic as the network densifies. We show that all of them follow from one local geometric length, the average inter-wire gap g, acting through the geometric inductance of a mesh finer than the thermal wavelength: $X_L = Z_0 (g/λ) \ln(2g/πD)$, a parameter-free reactance that exceeds the ohmic loss and, unlike the DC sheet resistance, stays finite instead of diverging at the percolation threshold. Since the gap is fixed by areal density and wire diameter alone, the optics is length-independent and decoupled from percolative transport; what has been read as a second, optical percolation is instead a smooth impedance crossing. With a single fitted parameter the theory reproduces 56 silver-nanowire samples across four diameters to a mean absolute error of 0.04, collapses them onto one universal curve, and - unchanged - predicts the emissivity-transmittance data of five independent groups and the measured spectral emissivity, including the silica phonon band. Because this reactance contains no material constant, the inter-wire gap emerges as the master design variable for the radiative properties of metallic nanowire transparent conductors.

cond-mat.mes-hall

Challenges and mitigation pathways in coating silver nanowire networks with metallic oxides by RF magnetron sputtering

As silver nanowire (AgNW) networks reach increasing technological maturity, research efforts are progressively shifting toward their integration into functional devices. In this context, it is essential to assess how thin film coating processes affect the structural and functional integrity of these transparent conducting networks. Radio Frequency (RF) magnetron sputtering is among the most widely used and industrially scalable deposition techniques, making a detailed understanding of its impact on AgNW networks particularly critical. In this work, we experimentally investigate the degradation of AgNW networks observed under specific RF magnetron sputtering regimes. By varying deposition time, oxygen partial pressure, target material, buffer layers and plasma power, we analyze how sputtering conditions influence the electrical, morphological, and structural properties of the networks. Based on these observations, we identify viable strategies to mitigate or suppress network degradation, thereby enabling safer and more reliable coating protocols. These results provide practical guidelines for the integration of AgNW networks into multilayer device architectures.

cond-mat.mtrl-sci