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Amirafshar Moshtaghpour

Publications and source records attributed to Amirafshar Moshtaghpour.

At least 19 recordsLinked to original sources

Proceedings of the second edition of the International Symposium on Computational Sensing (ISCS25)

The International Symposium on Computational Sensing (ISCS) brings together researchers from optical microscopy, electron microscopy, RADAR, astronomical imaging, biomedical imaging, remote sensing, and signal processing. With a particular focus on applications and demonstrators, the purpose of this symposium is to be a forum where researchers in computational sensing working in seemingly unrelated applications can learn, discover, and exchange on their new findings and challenges. This 3-day symposium in the heart of Europe features 6 keynotes speakers and is open to extended abstracts for scientific presentations and show-and-tell demonstrations.

eess.SP↗

Electron Fourier ptychography for phase reconstruction

Phase reconstruction is important in transmission electron microscopy for structural studies. We describe electron Fourier ptychography and its application to phase reconstruction of both radiation-resistant and beam-sensitive materials. We demonstrate that the phase of the exit wave can be reconstructed to high resolution using a modified iterative phase retrieval algorithm using data collected in an alternative optical geometry. This method achieves a spatial resolution of 0.63 nm at a fluence of $4.5 \times 10^2 \, e^-/\text{nm}^2$, as validated on Cry11Aa protein crystals under cryogenic conditions. Notably, this method requires no additional hardware modifications, is straightforward to implement, and can be seamlessly integrated with existing data collection software, providing a broadly accessible alternative approach to structural studies.

physics.app-ph↗

Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent studies suggest that certain types of damage can be modelled as a diffusion process. However, numerical simulation of such diffusion processes has remained computationally intensive. This work introduces a high-performance C++ framework for simulating damage diffusion process in STEM that combines efficient numerical computation, advanced visualisations, and multithreading to achieve efficient runtime while maintaining accuracy.

eess.SP↗

On Overlap Ratio in Defocused Electron Ptychography

Four-dimensional Scanning Transmission Electron Microscopy (4D STEM) with data acquired using a defocused electron probe is a promising tool for characterising complex biological specimens and materials through a phase retrieval process known as Electron Ptychography (EP). The efficacy of 4D STEM acquisition and the resulting quality of EP reconstruction depends on the overlap ratio of adjacent illuminated areas. This paper demonstrates how the overlap ratio impacts the data redundancy and the quality of the EP reconstruction. We define two quantities as a function of the overlap ratio that are independent of both the object and the EP algorithm. Subsequently, we evaluate an EP algorithm for varying overlap ratios using simulated 4D STEM datasets. Notably, a 40% or greater overlap ratio yields stable, high-quality reconstructions.

eess.SP↗

LoRePIE: $\ell_0$ Regularised Extended Ptychographical Iterative Engine for Low-dose and Fast Electron Ptychography

The extended Ptychographical Iterative Engine (ePIE) is a widely used phase retrieval algorithm for Electron Ptychography from 4-dimensional (4-D) Scanning Transmission Electron Microscopy (4-D STEM) measurements acquired with a focused or defocused electron probe. However, ePIE relies on redundancy in the data and hence requires adjacent illuminated areas to overlap. In this paper, we propose a regularised variant of ePIE that is more robust to low overlap ratios. We examine the performance of the proposed algorithm on an experimental 4-D STEM data of double layered Rotavirus particles acquired in a full scan with 85% overlap. By artificial down-sampling of the probe positions, we have created synthetic 4-D STEM datasets with different overlap ratios and use these to show that a high quality reconstruction of Rotavirus particles can be obtained from data with an overlap as low as 56%.

physics.app-ph↗

Compressive Electron Backscatter Diffraction Imaging

Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample preparation, relatively slow acquisition, and damage in beam-sensitive samples, still limit the quantity and quality of interpretable data that can be obtained. To mitigate these issues, here we propose a method based on the subsampling of probe positions and subsequent reconstruction of an incomplete dataset. The missing probe locations (or pixels in the image) are recovered via an inpainting process using a dictionary-learning based method called beta-process factor analysis (BPFA). To investigate the robustness of both our inpainting method and Hough-based indexing, we simulate subsampled and noisy EBSD datasets from a real fully sampled Ni-superalloy dataset for different subsampling ratios of probe positions using both Gaussian and Poisson noise models. We find that zero solution pixel detection (inpainting un-indexed pixels) enables higher quality reconstructions to be obtained. Numerical tests confirm high quality reconstruction of band contrast and inverse pole figure maps from only 10% of the probe positions, with the potential to reduce this to 5% if only inverse pole figure maps are needed. These results show the potential application of this method in EBSD, allowing for faster analysis and extending the use of this technique to beam sensitive materials.

eess.IV↗

Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy

Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent reports suggest that certain types of damage can be modeled as a diffusion process and that the accumulation effects of this process must be kept low in order to reduce damage. We therefore develop an explicit mathematical formulation of spatiotemporal diffusion processes in STEM that take into account both instrument and sample parameters. Furthermore, our framework can aid the design of Diffusion Controlled Sampling (DCS) strategies using optimally selected probe positions in STEM, that constrain the cumulative diffusion distribution. Numerical simulations highlight the variability of the cumulative diffusion distribution for different experimental STEM configurations. These analytical and numerical frameworks can subsequently be used for careful design of 2- and 4-dimensional STEM experiments where beam damage is minimised.

cond-mat.mtrl-sci↗

Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques

Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requires only that a random subset of probe locations is acquired from the typical regular scanning grid, which immediately generates both higher speed and the lower fluence experimentally. We also consider downsampling of the detector, showing that oversampling is inherent within convergent beam electron diffraction (CBED) patterns, and that detector downsampling does not reduce precision but allows faster experimental data acquisition. Analysis of an experimental atomic resolution yttrium silicide data-set shows that it is possible to recover over 25dB peak signal-to-noise in the recovered phase using 0.3% of the total data.

cond-mat.mtrl-sci↗

SenseAI: Real-Time Inpainting for Electron Microscopy

Despite their proven success and broad applicability to Electron Microscopy (EM) data, joint dictionary-learning and sparse-coding based inpainting algorithms have so far remained impractical for real-time usage with an Electron Microscope. For many EM applications, the reconstruction time for a single frame is orders of magnitude longer than the data acquisition time, making it impossible to perform exclusively subsampled acquisition. This limitation has led to the development of SenseAI, a C++/CUDA library capable of extremely efficient dictionary-based inpainting. SenseAI provides N-dimensional dictionary learning, live reconstructions, dictionary transfer and visualization, as well as real-time plotting of statistics, parameters, and image quality metrics.

eess.SP↗

The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography

Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive materials, these images are often compromised by additional constraints related to beam damage and the devitrification of the material during imaging, which renders data acquisition both costly and unreliable. Subsampling and inpainting are proposed as solutions for both of these aspects, allowing fast and low-dose imaging to take place in the FIB-SEM without an appreciable low in image quality. In this work, experimental data is presented which validates subsampling and inpainting as a useful tool for convenient and reliable data acquisition in a FIB-SEM, with new methods of handling 3-dimensional data being employed in context of dictionary learning and inpainting algorithms using a newly developed microscope control software and data recovery algorithm.

physics.med-ph↗

Proceedings of the first edition of the International Symposium on Computational Sensing (ISCS23)

The International Symposium on Computational Sensing (ISCS) brings together researchers from optical microscopy, electron microscopy, RADAR, astronomical imaging, biomedical imaging, remote sensing, and signal processing. With a particular focus on applications and demonstrators, the purpose of this symposium is to be a forum where researchers in computational sensing working in seemingly unrelated applications can learn, discover, and exchange on their new findings and challenges. This 3-day symposium in the heart of Europe features 6 keynotes speakers and is open to extended abstracts for scientific presentations and show-and-tell demonstrations.

eess.SP↗

Scan Coil Dynamics Simulation for Subsampled Scanning Transmission Electron Microscopy

Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of the electron probe beam as a function of the history of the scan. Hysteresis limits the resolution of the microscope and can induce artefacts in our images, particularly during flyback. In this work, we aim to provide insights on the effects of hysteresis during image formation. To accomplish this, a simulation has been developed to model a scanning system as a damped double-harmonic oscillator, with the simulation being capable of managing many microscope dependant parameters to study the effect on the resultant scan trajectories. The model developed shows that the trajectory of the electron beam probe is not obvious and the relationship between scanning pattern and probe trajectory is complex.

physics.comp-ph↗

Subsampling Methods for Fast Electron Backscattered Diffraction Analysis

Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) diffraction maps for every position of a convergent electron probe on the sample, is limited by the capacity of the detector. Such 4D data enables computation of, e.g., band contrast and Inverse Pole Figure (IPF) maps, used for material characterisation. In this work we propose a fast acquisition method of EBSD data through subsampling 2-D probe positions and inpainting. We investigate reconstruction of both band contrast and IPF maps using an unsupervised Bayesian dictionary learning approach, i.e., Beta process factor analysis. Numerical simulations achieve high quality reconstructed images from 10% subsampled data.

eess.SP↗

In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data

High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the properties of complex materials such as battery cathodes; however, multidimensional techniques (such as 4-D STEM) which can improve resolution and sample information are ultimately limited by the beam-damage properties of the materials or the signal-to-noise ratio of the result. subsampling offers a solution to this problem by retaining high signal, but distributing the dose across the sample such that the damage can be reduced. It is for these reasons that we propose a method of subsampling for 4-D STEM, which can take advantage of the redundancy within said data to recover functionally identical results to the ground truth. We apply these ideas to a simulated 4-D STEM data set of a LiMnO2 sample and we obtained high quality reconstruction of phase images using 12.5% subsampling.

cond-mat.mtrl-sci↗

A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy

Cryo Focused Ion-Beam Scanning Electron Microscopy (cryo FIB-SEM) enables three-dimensional and nanoscale imaging of biological specimens via a slice and view mechanism. The FIB-SEM experiments are, however, limited by a slow (typically, several hours) acquisition process and the high electron doses imposed on the beam sensitive specimen can cause damage. In this work, we present a compressive sensing variant of cryo FIB-SEM capable of reducing the operational electron dose and increasing speed. We propose two Targeted Sampling (TS) strategies that leverage the reconstructed image of the previous sample layer as a prior for designing the next subsampling mask. Our image recovery is based on a blind Bayesian dictionary learning approach, i.e., Beta Process Factor Analysis (BPFA). This method is experimentally viable due to our ultra-fast GPU-based implementation of BPFA. Simulations on artificial compressive FIB-SEM measurements validate the success of proposed methods: the operational electron dose can be reduced by up to 20 times. These methods have large implications for the cryo FIB-SEM community, in which the imaging of beam sensitive biological materials without beam damage is crucial.

eess.SP↗

SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation

Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the pixels in the image experimentally and then reconstructing the full image using an inpainting algorithm. In this paper, we apply the same inpainting approach (a form of compressed sensing) to simulated, sub-sampled atomic resolution STEM images. We find that it is possible to significantly sub-sample the area that is simulated, the number of g-vectors contributing the image, and the number of frozen phonon configurations contributing to the final image while still producing an acceptable fit to a fully sampled simulation. Here we discuss the parameters that we use and how the resulting simulations can be quantifiably compared to the full simulations. As with any Compressed Sensing methodology, care must be taken to ensure that isolated events are not excluded from the process, but the observed increase in simulation speed provides significant opportunities for real time simulations, image classification and analytics to be performed as a supplement to experiments on a microscope to be developed in the future.

cond-mat.mtrl-sci↗

Compressive Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological specimens. In many cases, however, the resolution is limited by the electron beam damage, since in traditional STEM, a focused electron beam scans every location of the sample in a raster fashion. In this paper, we propose a scanning method based on the theory of Compressive Sensing (CS) and subsampling the electron probe locations using a line hop sampling scheme that significantly reduces the electron beam damage. We experimentally validate the feasibility of the proposed method by acquiring real CS-STEM data, and recovering images using a Bayesian dictionary learning approach. We support the proposed method by applying a series of masks to fully-sampled STEM data to simulate the expectation of real CS-STEM. Finally, we perform the real data experimental series using a constrained-dose budget to limit the impact of electron dose upon the results, by ensuring that the total electron count remains constant for each image.

eess.SP↗

DeepSportLab: a Unified Framework for Ball Detection, Player Instance Segmentation and Pose Estimation in Team Sports Scenes

This paper presents a unified framework to (i) locate the ball, (ii) predict the pose, and (iii) segment the instance mask of players in team sports scenes. Those problems are of high interest in automated sports analytics, production, and broadcast. A common practice is to individually solve each problem by exploiting universal state-of-the-art models, \eg, Panoptic-DeepLab for player segmentation. In addition to the increased complexity resulting from the multiplication of single-task models, the use of the off-the-shelf models also impedes the performance due to the complexity and specificity of the team sports scenes, such as strong occlusion and motion blur. To circumvent those limitations, our paper proposes to train a single model that simultaneously predicts the ball and the player mask and pose by combining the part intensity fields and the spatial embeddings principles. Part intensity fields provide the ball and player location, as well as player joints location. Spatial embeddings are then exploited to associate player instance pixels to their respective player center, but also to group player joints into skeletons. We demonstrate the effectiveness of the proposed model on the DeepSport basketball dataset, achieving comparable performance to the SoA models addressing each individual task separately.

cs.CV↗