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Andrés Conca

Publications and source records attributed to Andrés Conca.

2 recordsLinked to original sources

Off-stoichiometric variable doping for exceptional power factors in L2$_1$ Fe$_2$VAlM$_x$ (M=Ti, W) epitaxial thin films

We show that the addition of Ti or W to stoichiometric L2$_1$ Fe$_2$VAl thin films by sputter codeposition produces off stoichiometric thin film alloys with superior thermoelectric properties than their stoichiometric counterparts. Ti incorporation induces p-type semiconducting behavior, while W incorporation shifts the material toward n-type, hereby enabling simultaneous tuning of both carrier types within a single parent (Fe$_2$VAl) material system, making it highly desirable for thermoelectric devices. The introduction of both Ti and W partly substitutes V in the stoichiometric compound. The partial substitution of V in the stoichiometric alloy allows fine-tuning the band structure of the system and transport properties. With this approach we obtain exceptional maximum power factor values for p and n-type films of 1300 $μ$W/m$\cdot$K$^2$ and 2100 $μ$W/m$\cdot$K$^2$ ,respectively, yielding maximum figures of merit zT of 0.07 and 0.14, respectively.

cond-mat.mtrl-sci

Measurements of the exchange stiffness of YIG films by microwave resonance techniques

Measurements of the exchange stiffness $D$ and the exchange constant $A$ of Yttrium Iron Garnet (YIG) films are presented. The YIG films with thicknesses from 0.9 $μ$m to 2.6 $μ$m were investigated with a microwave setup in a wide frequency range from 5 to 40 GHz. The measurements were performed when the external static magnetic field was applied in-plane and out-of-plane. The method of Schreiber and Frait, based on the analysis of the perpendicular standing spin wave (PSSW) mode frequency dependence on the applied out-of-plane magnetic field, was used to obtain the exchange stiffness $D$. This method was modified to avoid the influence of internal magnetic fields during the determination of the exchange stiffness. Furthermore, the method was adapted for in-plane measurements as well. The results obtained using all methods are compared and values of $D$ between $(5.18\pm0.01) \cdot 10^{-17}$T$\cdot$m$^2$ and $(5.34\pm0.02) \cdot 10^{-17}$ T$\cdot$m$^2$ were obtained for different thicknesses. From this the exchange constant was calculated to be $A=(3.65 \pm 0.38)~$pJ/m.

cond-mat.mtrl-sci