arXiv subjects

Andrea Mifsud

Publications and source records attributed to Andrea Mifsud.

6 recordsLinked to original sources

arXiv2022

An Open-Source RRAM Compiler

Memory compilers are necessary tools to boost the design procedure of digital circuits. However, only a few are available to academia. Resistive Random Access Memory (RRAM) is characterised by high density, high speed, non volatility and is a potential candidate of future digital memories. To the best of the authors' knowledge, this paper presents the first open source RRAM compiler for automatic memory generation including its peripheral circuits, verification and timing characterisation. The RRAM compiler is written with Cadence SKILL programming language and is integrated in Cadence environment. The layout verification procedure takes place in Siemens Mentor Calibre tool. The technology used by the compiler is TSMC 180nm. This paper analyses the novel results of a plethora of M x N RRAMs generated by the compiler, up to M = 128, N = 64 and word size B = 16 bits, for clock frequency equal to 12.5 MHz. Finally, the compiler achieves density of up to 0.024 Mb/mm2.

cs.ET↗

arXiv2022

A CMOS-based Characterisation Platform for Emerging RRAM Technologies

Mass characterisation of emerging memory devices is an essential step in modelling their behaviour for integration within a standard design flow for existing integrated circuit designers. This work develops a novel characterisation platform for emerging resistive devices with a capacity of up to 1 million devices on-chip. Split into four independent sub-arrays, it contains on-chip column-parallel DACs for fast voltage programming of the DUT. On-chip readout circuits with ADCs are also available for fast read operations covering 5-decades of input current (20nA to 2mA). This allows a device's resistance range to be between 1k$Ω$ and 10M$Ω$ with a minimum voltage range of $\pm$1.5V on the device.

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arXiv2022

A Wide Dynamic Range Read-out System For Resistive Switching Technology

The memristor, because of its controllability over a wide dynamic range of resistance, has emerged as a promising device for data storage and analog computation. A major challenge is the accurate measurement of memristance over a wide dynamic range. In this paper, a novel read-out circuit with feedback adjustment is proposed to measure and digitise input current in the range between 20nA and 2mA. The magnitude of the input currents is estimated by a 5-stage logarithmic current-to-voltage amplifier which scales a linear analog-to-digital converter. This way the least significant bit tracks the absolute input magnitude. This circuit is applicable to reading single memristor conductance, and is also preferable in analog computing where read-out accuracy is particularly critical. The circuits have been realized in Bipolar-CMOS-DMOS (BCD) Gen2 technology.

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arXiv2022

A High-Voltage Characterisation Platform For Emerging Resistive Switching Technologies

Emerging memristor-based array architectures have been effectively employed in non-volatile memories and neuromorphic computing systems due to their density, scalability and capability of storing information. Nonetheless, to demonstrate a practical on-chip memristor-based system, it is essential to have the ability to apply large programming voltage ranges during the characterisation procedures for various memristor technologies. This work presents a 16x16 high voltage memristor characterisation array employing high voltage CMOS circuitry. The proposed system has a maximum programming range of $\pm22V$ to allow on-chip electroforming and I-V sweep. In addition, a Kelvin voltage sensing system is implemented to improve the readout accuracy for low memristance measurements. This work addresses the limitation of conventional CMOS-memristor platforms which can only operate at low voltages, thus limiting the characterisation range and integration options of memristor technologies.

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arXiv2021

Hybrid CMOS/Memristor Circuit Design Methodology

RRAM technology has experienced explosive growth in the last decade, with multiple device structures being developed for a wide range of applications. However, transitioning the technology from the lab into the marketplace requires the development of an accessible and user-friendly design flow, supported by an industry-grade toolchain. In this work, we demonstrate with examples an end-to-end design flow for RRAM-based electronics, from the introduction of a custom RRAM model into our chosen CAD tool to performing layout-versus-schematic and post-layout checks including the RRAM device. We envisage that this step-by-step guide to introducing RRAM into the standard integrated circuit design flow will be a useful reference document for both device developers who wish to benchmark their technologies and circuit designers who wish to experiment with RRAM-enhanced systems.

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arXiv2021

Open-Source Memory Compiler for Automatic RRAM Generation and Verification

The lack of open-source memory compilers in academia typically causes significant delays in research and design implementations. This paper presents an open-source memory compiler that is directly integrated within the Cadence Virtuoso environment using physical verification tools provided by Mentor Graphics (Calibre). It facilitates the entire memory generation process from netlist generation to layout implementation, and physical implementation verification. To the best of our knowledge, this is the first open-source memory compiler that has been developed specifically to automate Resistive Random Access Memory (RRAM) generation. RRAM holds the promise of achieving high speed, high density and non-volatility. A novel RRAM architecture, additionally is proposed, and a number of generated RRAM arrays are evaluated to identify their worst case control line parasitics and worst case settling time across the memristors of their cells. The total capacitance of lines SEL, N and P is 5.83 fF/cell, 3.31 fF/cell and 2.48 fF/cell respectively, while the total calculated resistance for SEL is 1.28 Ohm/cell and 0.14 Ohm/cell for both N and P lines.

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