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Andreas Wucher

Publications and source records attributed to Andreas Wucher.

5 recordsLinked to original sources

Non-equilibrium dynamics of electron emission from cold and hot graphene under proton irradiation

Characteristic properties of secondary electrons emitted from irradiated two-dimensional materials arise from multi-length and time-scale relaxation processes that connect the initial non-equilibrium excited electron distribution with their eventual emission. To understand these processes, which are critical for using secondary electrons as high-resolution thermalization probes, we combine first-principles real-time electron dynamics with modern experiments. Our data for cold and hot proton-irradiated graphene shows signatures of kinetic and potential emission and generally good agreement for electron yields between experiment and theory. The duration of the emission pulse is about 1.5 femtoseconds, indicating high time resolution when used as a probe. Our newly developed method to predict kinetic energy spectra shows good agreement with electron and ion irradiation experiments and prior models. We find that lattice temperature significantly increases secondary electron emission, whereas electron temperature has a negligible effect.

cond-mat.mtrl-sci

Characterization of a supersonic gas jet via laser-induced photoelectron ionization

We describe the characterization of a pulsed supersonic rare gas beam which is intended to serve as an ultracold neutral atom target for the production of an ultrashort ion pulse via femtosecond photoionization. The velocity distribution of atoms entrained in the beam is measured and characterized by temperatures $T_\parallel$ and $T_\perp$ in directions along and perpendicular to the beam propagation, respectively. It is shown that $T_\perp$ values in the mK regime are achieved at distances of the order of 1000 mm from the nozzle. Moreover, the center beam density at this position is measured to be of the order of $10^{11} atoms/cm^{3}$. Both findings are essential for the intended application and confirm the targeted beam specifications. Comparison with theoretical estimates reveals the well-known skimmer interference effect, which is found to reduce the beam density by more than one order of magnitude.

physics.ins-det

SHIPS: A new setup for the investigation of swift heavy ion induced particle emission and surface modifications

The irradiation with fast ions with kinetic energies of > 10 MeV leads to the deposition of a high amount of energy along their trajectory (up to several ten keV/nm). The energy is mainly transferred to the electronic subsystem and induces different secondary processes of excitations which result in significant material modifications. A new setup to study these ion induced effects on surfaces will be described in this paper. The setup combines a variable irradiation chamber with different techniques of surface characterizations like scanning probe microscopy, time-of-flight secondary ion and neutral mass spectrometry, as well as low energy electron diffraction under ultra high vacuum conditions, and is mounted at a beamline of the universal linear accelerator (UNILAC) of the GSI facility in Darmstadt, Germany. Here, samples can be irradiated with high-energy ions with a total kinetic energy up to several GeVs under different angles of incidence. Our setup enables the preparation and in-situ analysis of different types of sample systems ranging from metals to insulators. Time-of-flight secondary ion mass spectrometry enables us to study the chemical composition of the surface, while scanning probe microscopy allows a detailed view into the local electrical and morphological conditions of the sample surface down to atomic scales. With the new setup particle emission during irradiation as well as persistent modifications of the surface after irradiation can thus be studied. We present first data obtained with the new setup, including a novel measuring protocol for time-of-flight mass spectrometry with the GSI UNILAC accelerator.

physics.ins-det

HICS: Highly charged ion collisions with surfaces

The layout of a new instrument designed to study the interaction of highly charged ions with surfaces, which consists of an ion source, a beamline including charge separation and a target chamber, is presented here. By varying the charge state and impact velocity of the projectiles separately, the dissipation of potential and kinetic energy at or below the surface can be studied independently. The target chamber offers the use of tunable metal-insulator-metal devices as detectors for internal electronic excitation, a timeof-flight system to study the impact induced particle emission and the possibility to transfer samples in situ to a UHV scanning probe microscope. Samples and detectors can be prepared in situ as well. As a first example data on graphene layers on SrTiO3 which have been irradiated with Xe36+ are presented. Key words: highly charged ions, sputtering, AFM, graphene

physics.ins-det

Hot electrons induced by (rather) cold ions

Thin film metal-insulator-metal junctions are used in a novel approach to investigate the dissipation of potential energy of multiply charged ions impinging on a polycrystalline metal surface. The ion-metal interaction leads to excited electrons and holes within the top layer. A substantial fraction of these charge carriers is transported inwards and can be measured as an internal current in the thin film tunnel junction. In Ag-AlOX-Al junctions, yields of typically 0.1-1 electrons per impinging ion are detected in the bottom Al layer. The separate effects of potential and kinetic energy on the tunneling yield are investigated by varying the charges state of the Ar projectile ions from 2+ to 9+ for kinetic energies in the range from 1 to 12 keV. The tunneling yield is found to scale linearly with the potential energy of the projectile.

cond-mat.mtrl-sci