SearcharxivSearch

arXiv subjects

Anush Lingamoorthy

Publications and source records attributed to Anush Lingamoorthy.

2 recordsLinked to original sources

A Reconfigurable Hybrid Convolutional-Fully Connected Neuromorphic Core for Biomedical Edge Inference

This work presents a programmable FPGA-based architecture for spiking convolutional neural network (SCNN) inference, with real-time hypoxia classification serving as a biomedical edge application. The architecture implements a hybrid spiking convolutional-fully connected (CNN-FC) topology on a programmable, quantized, layer-based neuromorphic hardware core. Early layers perform spiking convolution using receptive-field connectivity with support for multi-channel kernels and stride, while deeper layers use fully connected spiking layers for classification. A PyTorch-based hardware-software co-design flow enables deployment of trained parameters with quantization and configurability support. The design is first validated on MNIST and Fashion-MNIST, achieving hardware accuracies of up to 98% and 86%, respectively, at 16-bit precision. It is then applied to hypoxia classification using red and infrared photoplethysmography (PPG) signals acquired from a shoulder-mounted sensor, with skin tone included as an additional input channel. The resulting classifier achieves an average hardware accuracy of 88.26% across five folds at 16-bit precision while consuming 1.455 W of dynamic power, demonstrating the feasibility of low-power neuromorphic biomedical classification at the edge.

eess.SY

Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification

In integrated circuit design, the analysis of wafer map patterns is critical to improve yield and detect manufacturing issues. We develop Wafer2Spike, an architecture for wafer map pattern classification using a spiking neural network (SNN), and demonstrate that a well-trained SNN achieves superior performance compared to deep neural network-based solutions. Wafer2Spike achieves an average classification accuracy of 98\% on the WM-811k wafer benchmark dataset. It is also superior to existing approaches for classifying defect patterns that are underrepresented in the original dataset. Wafer2Spike achieves this improved precision with great computational efficiency.

cs.NE